Electronic devices of the future could be smaller, faster, more powerful and consume less energy because of a discovery by researchers at the Department of Energy's Oak Ridge National Laboratory.
The key to the finding, published in Science, involves a method to measure intrinsic conducting properties of ferroelectric materials, which for decades have held tremendous promise but have eluded experimental proof. Now, however, ORNL Wigner Fellow Peter Maksymovych and co-authors Stephen Jesse, Art Baddorf and Sergei Kalinin at the Center for Nanophase Materials Sciences believe they may be on a path that will see barriers tumble.
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